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Pt/Ga/C and Pt/C composite nanowires fabricated by focused ion and electron beam induced deposition
Author(s) -
Li P. G.,
Jin A. Z.,
Tang W. H.
Publication year - 2006
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200521292
Subject(s) - nanowire , materials science , composite number , deposition (geology) , focused ion beam , electron beam induced deposition , ion , nanotechnology , ion beam , electrode , cathode ray , ion beam assisted deposition , chemical engineering , electron , transmission electron microscopy , chemistry , composite material , organic chemistry , scanning transmission electron microscopy , quantum mechanics , sediment , engineering , biology , paleontology , physics
Pt/Ga/C and Pt/C composite nanowires have been fabricated using ion beam induced deposition (IBID) and electron beam induced deposition (EBID), respectively, with a dual beam focused ion beam system. The Pt/Ga/C composite nanowires usually exhibit a semiconducting character and their resistances increase greatly as the temperature decreases. However, the Pt/C composite nanowires show metallic behaviour above 2 K. The results suggest that EBID is more suitable than IBID for fabricating measuring electrodes for nanomaterials and devices in a single‐step process. It has also been found that the resistance of the Pt/C nanowires decreases abruptly around 20 K, which could arise from a possible new phase formed between Pt and C. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)