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X‐ray topography of GdCa 4 O(BO 3 ) 3 single crystals grown by the Czochralski method
Author(s) -
Wierzbicka E.,
Kłos A.,
LefeldSosnowska M.,
Pajączkowska A.
Publication year - 2006
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200521030
Subject(s) - perpendicular , reflection (computer programming) , stoichiometry , materials science , crystallography , x ray , czochralski method , optics , single crystal , condensed matter physics , physics , chemistry , geometry , mathematics , organic chemistry , computer science , programming language
GdCa 4 O(BO 3 ) 3 single crystals grown by the Czochralski technique were investigated by conventional transmission and back‐reflection X‐ray topography. The results were correlated with the growth conditions and stoichiometry of the crystals. Extended defects, especially dislocations, with different density, in samples cut perpendicular and parallel to the b ‐axis were investigated. Long, straight dislocations lying perpendicular to [100] and [010] directions were observed. Periodical, small fluctuations of the diameter induced some defects. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)