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Porous silicon – rare earth doped xerogel and glass composites
Author(s) -
Balakrishnan S.,
Gun'ko Yurii K.,
Perova T. S.,
Rafferty A.,
Astrova E. V.,
Moore R. A.
Publication year - 2005
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200461229
Subject(s) - materials science , porous silicon , doping , silicon , scanning electron microscope , raman spectroscopy , porosity , composite material , gravimetric analysis , fourier transform infrared spectroscopy , porous medium , thermogravimetric analysis , chemical engineering , optoelectronics , optics , chemistry , organic chemistry , physics , engineering
The development of components for photonics applications is growing exponentially. The sol–gel method is now recognised as a convenient and flexible way to deposit oxide or glass films on a variety of hosts, including porous silicon. In the present work we incorporated erbium and europium doped xerogel into porous silicon and developed new porous silicon – rare earth doped glass composites. Various characteris‐ation techniques including FTIR, Raman Spectroscopy, Thermal Gravimetric Analysis and Scanning Electron Microscopy were employed in this work. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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