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Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry
Author(s) -
Arwin H.,
Karlsson L. M.,
Kozarcanin A.,
Thompson D. W.,
Tiwald T.,
Woollam J. A.
Publication year - 2005
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200461228
Subject(s) - ellipsometry , adsorption , porous silicon , carbonic anhydrase , infrared spectroscopy , infrared , silicon , chemistry , refractive index , porosity , absorption (acoustics) , carbonic anhydrase ii , matrix (chemical analysis) , materials science , analytical chemistry (journal) , chromatography , nanotechnology , enzyme , thin film , organic chemistry , optics , composite material , optoelectronics , physics
The refractive index N = n + ik of the protein bovine carbonic anhydrase (BCA) adsorbed in porous silicon layers is determined using infrared spectroscopic ellipsometry. Five absorption bands in the amide region are resolved. The distribution of the protein inside the porous matrix is modelled and it is found that more BCA per internal surface area are adsorbed in the upper part of the porous layer than in the bottom part. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)