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Impedance spectroscopy study of anodic growth of zirconium oxide film in NaOH medium
Author(s) -
Pauporté T.,
Finne J.,
Lincot D.
Publication year - 2005
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200461162
Subject(s) - dielectric spectroscopy , zirconium , materials science , scanning electron microscope , oxide , analytical chemistry (journal) , electrolyte , anode , dielectric , spectroscopy , layer (electronics) , electrical impedance , electrochemistry , composite material , metallurgy , chemistry , optoelectronics , electrode , electrical engineering , physics , chromatography , quantum mechanics , engineering
The growth of anodic oxide films on zirconium metal has been followed up to 300 V by electrochemical impedance spectroscopy and scanning electron microscopy. The maximum layer thickness is 720 nm, the dielectric constant of the film is measured at 19.5 and the growth constant is 2.4 nm V –1 . Above 50 V, the presence of two impedance relaxations between 1 Hz and 200 kHz reveals a bilayered structure. This may be a consequence of a lower resistivity of the outer layer induced by some electrolytic solution infiltration into film defects. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)