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Sum‐frequency generation from surface species in porous silicon
Author(s) -
Mattei G.,
Valentini V.,
Yakovlev V. A.,
Mani A. A.,
Sartenaer Y.,
Thiry P. A.,
Peremans A.,
Caudano Y.,
Dreesen L.,
Humbert C.,
Busson B.,
Vidal F.,
Tadjeddine A.
Publication year - 2005
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200461155
Subject(s) - porous silicon , photonic crystal , mesoporous material , materials science , band gap , silicon , range (aeronautics) , porosity , spectral line , signal (programming language) , infrared , absorption (acoustics) , photonics , infrared spectroscopy , porous medium , optoelectronics , analytical chemistry (journal) , optics , chemistry , composite material , physics , catalysis , biochemistry , astronomy , computer science , programming language , organic chemistry , chromatography
For the first time, the sum‐frequency generation (SFG) spectra of surface species have been measured in porous silicon (PS) layers. The range of the vibrations 2000–2300 cm –1 for the native species Si–H x has been explored. Furthermore for the studied mesoporous materials, it has been found that, as opposed to the infrared absorption, the SFG signal increases with porosity. Finally, the angular dependence and the enhancement of the SFG signal were measured in a one‐dimensional PS photonic crystal structure with a defect producing an energy level in the photonic band gap. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)