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Terahertz investigation of high quality indium nitride epitaxial layers
Author(s) -
Meziani Y. M.,
Maleyre B.,
Sadowski M. L.,
Ruffenach S.,
Briot O.,
Knap W.
Publication year - 2005
Publication title -
physica status solidi (a)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.532
H-Index - 104
eISSN - 1862-6319
pISSN - 1862-6300
DOI - 10.1002/pssa.200460434
Subject(s) - terahertz radiation , plasmon , cyclotron resonance , optoelectronics , materials science , scattering , dielectric function , phonon , dielectric , condensed matter physics , physics , optics , cyclotron , magnetic field , quantum mechanics
We report on the optical characterization of InN layers in the THz range and magnetic fields up to 13 T. The results are interpreted using the dielectric function formalism, with contributions of cyclotron resonance, phonons, plasmons and helicon wave excitations. We show how THz radiation transmission measurements can provide an optical contactless method of determining the quality (carrier density and momentum scattering rate) in the InN layers. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)