High‐temperature anomalies in resistivity and thermoelectric power of thick‐film resistors and their conduction mechanism | Zendy

Abdurakhmanov G. | Zendy; Abdurakhmanova N. G. | Zendy

Premium

High‐temperature anomalies in resistivity and thermoelectric power of thick‐film resistors and their conduction mechanism

Author(s) -

Abdurakhmanov G.,

Abdurakhmanova N. G.

Publication year - 2005

Publication title -

physica status solidi (a)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.532

H-Index - 104

eISSN - 1862-6319

pISSN - 1862-6300

DOI - 10.1002/pssa.200420036

Subject(s) - resistor , seebeck coefficient , electrical resistivity and conductivity , materials science , atmospheric temperature range , thermoelectric effect , thermal conduction , condensed matter physics , maxima , composite material , mineralogy , electrical engineering , thermodynamics , chemistry , thermal conductivity , physics , art , voltage , performance art , art history , engineering

Resistivity ρ and thermoelectric power S of RuO 2 ‐based thick‐film resistors were measured in tempera‐ ture range T = 77–1100 K. Sharp maxima of ρ and S occur at 1000 K. ρ = 7.5 × 10 3 Ω cm and S = +90 μV/K at the maxima, while ρ = 2.5 × 10 3 Ω cm and S = +10 μV/K at room temperature. Thermoelectric power becomes negative at temperatures in the range 700–800 K and 1000–1070 K. It is assumed that the peculiarities of ρ and S are caused by structural changes in compounds of the lead‐silicate glass used in the thick‐film resistors. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research