z-logo
Premium
Chitin synthesis inhibitor effect on Aedes aegypti populations susceptible and resistant to organophosphate temephos
Author(s) -
Martins Ademir Jesus,
Belinato Thiago Affonso,
Lima José Bento Pereira,
Valle Denise
Publication year - 2008
Publication title -
pest management science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.296
H-Index - 125
eISSN - 1526-4998
pISSN - 1526-498X
DOI - 10.1002/ps.1547
Subject(s) - aedes aegypti , biology , context (archaeology) , organophosphate , chitin , strain (injury) , toxicology , insect growth regulator , effective dose (radiation) , pesticide , insect , botany , larva , ecology , biochemistry , chitosan , medicine , paleontology , anatomy , radiology
Abstract BACKGROUND: In Brazil, dengue vector control is hampered by the resistance of Aedes aegypti L. populations to organophosphates (OPs). Insect growth regulators (IGRs) are a promising alternative, as their mechanisms of action are different from those of conventional insecticides. The authors analysed the effect of the IGR triflumuron, a chitin synthesis inhibitor, on the Ae. aegypti insecticide‐susceptible strain Rockefeller, as well as on field populations both susceptible (TemS) and resistant (TemR) to the OP temephos. RESULTS: Triflumuron arrested development and inhibited adult emergence of the Rockefeller strain in a dose‐dependent way (EI 50 and EI 90 of 0.8 and 1.8 µg L −1 respectively). A direct relationship between triflumuron concentration and the precocity of its effects was evident. TemS and TemR temephos resistance ratios (RR 90 ) were 4.5 and 13.8, triflumuron RR 90 being 1.0 and 1.3 respectively. CONCLUSION: The IGR triflumuron exhibited a dose‐dependent effect against the reference Ae. aegypti Rockefeller strain. It was also effective against two field populations, regardless of their OP resistance status. The present results are discussed in the context of utilization of chitin synthesis inhibitors as potential alternatives in the control of Ae. aegypti in Brazil. Copyright © 2008 Society of Chemical Industry

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here