Pauli tomography: complete characterization of a single qubit device | Zendy

Mazzei A. | Zendy; Ricci M. | Zendy; De Martini F. | Zendy; D'Ariano G.M. | Zendy

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Pauli tomography: complete characterization of a single qubit device

Author(s) -

Mazzei A.,

Ricci M.,

De Martini F.,

D'Ariano G.M.

Publication year - 2003

Publication title -

fortschritte der physik

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.469

H-Index - 71

eISSN - 1521-3978

pISSN - 0015-8208

DOI - 10.1002/prop.200310047

Subject(s) - qubit , pauli exclusion principle , characterization (materials science) , state (computer science) , quantum tomography , computer science , pauli matrices , process (computing) , physics , topology (electrical circuits) , one way quantum computer , quantum , quantum mechanics , quantum state , algorithm , quantum error correction , electrical engineering , engineering , optics , operating system

We present the first full experimental characterization of a single‐qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n ‐qubits processing device.

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