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Pauli tomography: complete characterization of a single qubit device
Author(s) -
Mazzei A.,
Ricci M.,
De Martini F.,
D'Ariano G.M.
Publication year - 2003
Publication title -
fortschritte der physik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.469
H-Index - 71
eISSN - 1521-3978
pISSN - 0015-8208
DOI - 10.1002/prop.200310047
Subject(s) - qubit , pauli exclusion principle , characterization (materials science) , state (computer science) , quantum tomography , computer science , pauli matrices , process (computing) , physics , topology (electrical circuits) , one way quantum computer , quantum , quantum mechanics , quantum state , algorithm , quantum error correction , electrical engineering , engineering , optics , operating system
We present the first full experimental characterization of a single‐qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n ‐qubits processing device.