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Atomic resolution structure determination by the cryo‐EM method MicroED
Author(s) -
Liu Shian,
Hattne Johan,
Reyes Francis E.,
SanchezMartinez Silvia,
Jason de la Cruz M.,
Shi Dan,
Gonen Tamir
Publication year - 2017
Publication title -
protein science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.353
H-Index - 175
eISSN - 1469-896X
pISSN - 0961-8368
DOI - 10.1002/pro.2989
Subject(s) - cryo electron microscopy , nanotechnology , physics , statistical physics , materials science , nuclear magnetic resonance
The electron cryo‐microscopy (cryoEM) method MicroED has been rapidly developing. In this review we highlight some of the key steps in MicroED from crystal analysis to structure determination. We compare and contrast MicroED and the latest X‐ray based diffraction method the X‐ray free‐electron laser (XFEL). Strengths and shortcomings of both MicroED and XFEL are discussed. Finally, all current MicroED structures are tabulated with a view to the future.