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HMX as an Impurity in RDX Particles: Effect on the Shock Sensitivity of Formulations Based on RDX
Author(s) -
Borne Lionel,
Ritter Helmut
Publication year - 2006
Publication title -
propellants, explosives, pyrotechnics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.56
H-Index - 65
eISSN - 1521-4087
pISSN - 0721-3115
DOI - 10.1002/prep.200600066
Subject(s) - impurity , scanning electron microscope , materials science , refractive index , solvent , shock (circulatory) , optical microscope , chemical engineering , analytical chemistry (journal) , composite material , chemistry , chromatography , organic chemistry , optoelectronics , medicine , engineering
Two main kinds of heterogeneities are pointed out in RDX particles in using optical microscopy with matching refractive index and scanning electron microscopy. These are HMX impurities and solvent inclusions.