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Sputum eosinophil apoptotic rate is positively correlated to exhaled nitric oxide in children
Author(s) -
Pontin Jennifer,
Blaylock Morgan G.,
Walsh Garry M.,
Turner Stephen W.
Publication year - 2008
Publication title -
pediatric pulmonology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.866
H-Index - 106
eISSN - 1099-0496
pISSN - 8755-6863
DOI - 10.1002/ppul.20921
Subject(s) - eosinophil , medicine , exhaled nitric oxide , sputum , asthma , eosinophil cationic protein , immunology , spirometry , biomarker , nitric oxide , gastroenterology , pathology , chemistry , tuberculosis , biochemistry
Rationale for Study Exhaled nitric oxide (FE NO ), a potential biomarker for asthma, is positively correlated with eosinophilic airway inflammation. Eosinophil apoptotic rate (AR) may be increased by NO but the relationship between eosinophil AR and NO has not been studied in vivo. This study tested the hypothesis that eosinophil AR will be positively related to FE NO . Methods Children with and without asthma were recruited and participated in an assessment that included FE NO measurement, skin prick reactivity, spirometry, and sputum induction. The absolute sputum eosinophil count and eosinophil AR were determined by morphology under light microscope after staining. Results There were 31 children recruited, mean age 11 years, 21 were asthmatic and 19 were boys. The median FE NO (range) was 15.6 parts per billion (3.1–102.6), 17 were atopic and the mean (SD)% FEV 1 was 85 (10)%. Sputum eosinophil AR was determined in 19 children (16 asthmatics), mean (SD) value 0.49 (0.13). There were positive relationships between eosinophil AR and FE NO (Spearman rho = 0.46, P = 0.046), eosinophil AR and % eosinophil count (Spearman rho = 0.45, P = 0.050) and also FE NO and % eosinophil count (Spearman rho = 0.49, P = 0.024). Conclusion There is a positive relationship between FE NO and eosinophil AR. Nitric oxide may be involved in regulation of eosinophil AR in the airways. Pediatr Pulmonol. 2008; 43:1130–1134. © 2008 Wiley‐Liss, Inc.