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Real‐Time Reconstruction of Arbitrary Slices for Quantitative and In Situ 3D Characterization of Nanoparticles
Author(s) -
Vanrompay Hans,
Buurlage JanWillem,
Pelt Daniël M.,
Kumar Vished,
Zhuo Xiaolu,
LizMarzán Luis M.,
Bals Sara,
Batenburg K. Joost
Publication year - 2020
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/ppsc.202000073
Subject(s) - workflow , characterization (materials science) , in situ , computer science , 3d reconstruction , nanoparticle , electron tomography , tomography , workstation , nanotechnology , computational science , materials science , computer vision , chemistry , physics , optics , transmission electron microscopy , organic chemistry , scanning transmission electron microscopy , database , operating system
A detailed 3D investigation of nanoparticles at a local scale is of great importance to connect their structure and composition to their properties. Electron tomography has therefore become an important tool for the 3D characterization of nanomaterials. 3D investigations typically comprise multiple steps, including acquisition, reconstruction, and analysis/quantification. Usually, the latter two steps are performed offline, at a dedicated workstation. This sequential workflow prevents on‐the‐fly control of experimental parameters to improve the quality of the 3D reconstruction, to select a relevant nanoparticle for further characterization, or to steer an in situ tomography experiment. Here, an efficient approach to overcome these limitations is presented, based on the real‐time reconstruction of arbitrary 2D reconstructed slices through a 3D object. Implementation of this method may lead to generalized implementation of electron tomography for routine nanoparticle characterization in 3D.