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Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography
Author(s) -
Sentosun Kadir,
Lobato Ivan,
Bladt Eva,
Zhang Yang,
Palenstijn Willem Jan,
Batenburg Kees Joost,
Van Dyck Dirk,
Bals Sara
Publication year - 2017
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/ppsc.201700287
Subject(s) - interpolation (computer graphics) , projection (relational algebra) , computer vision , artificial intelligence , inpainting , computer science , characterization (materials science) , iterative reconstruction , tilt (camera) , artifact (error) , tomography , 3d reconstruction , electron tomography , reduction (mathematics) , optics , algorithm , mathematics , image (mathematics) , physics , scanning electron microscope , geometry , scanning transmission electron microscopy
Electron tomography is a well‐known technique providing a 3D characterization of the morphology and chemical composition of nanoparticles. However, several reasons hamper the acquisition of tilt series with a large number of projection images, which deteriorate the quality of the 3D reconstruction. Here, an inpainting method that is based on sinogram interpolation is proposed, which enables one to reduce artifacts in the reconstruction related to a limited tilt series of projection images. The advantages of the approach will be demonstrated for the 3D characterization of nanoparticles using phantoms and several case studies.