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X‐Ray Diffractometry with Low Power Microfocus Sources – New Possibilities in the Lab
Author(s) -
Wiesmann Jörg,
Graf Jürgen,
Hoffmann Christian,
Hembd Alexandra,
Michaelsen Carsten,
Yang Ning,
Cordes Holger,
He Bob,
Preckwinkel Uwe,
Erlacher Kurt
Publication year - 2009
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/ppsc.200800052
Subject(s) - optics , detector , beam (structure) , x ray optics , materials science , focus (optics) , transmission (telecommunications) , scattering , tube (container) , resolution (logic) , crystallite , range (aeronautics) , x ray , physics , computer science , engineering , electrical engineering , artificial intelligence , metallurgy , composite material
Abstract Results from a new type of stationary microfocusing sealed tube X‐ray source will be presented here. Measurements obtained with the new low maintenance, high brilliance microfocus source IμS™ equipped with different 2‐dimensional beam shaping multilayer optics are shown. A comparison of the IμS source with typical sealed tube fine focus systems shows data of outstanding quality achieved in diffractometry applications using a 2‐dimensional detector. A large improvement in intensity (by a factor of about 16) was observed. Very promising results were achieved when measuring powders in transmission geometry using the IμS. With this way of focusing on the detector, better crystallite statistics and better resolution were provided. Intensity gain factors in the range of 100 were possible with some applications. For small angle scattering a factor of five was observed when using an IμS with optics for a parallel beam in comparison to a typical sealed tube instrument.