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Hard X‐Rays for In Situ Strain and Texture Measurements
Author(s) -
Brokmeier HeinzGünter
Publication year - 2009
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/ppsc.200800050
Subject(s) - synchrotron radiation , synchrotron , materials science , texture (cosmology) , strain (injury) , tension (geology) , radiation , compression (physics) , diffraction , in situ , x ray , optics , physics , composite material , artificial intelligence , computer science , image (mathematics) , medicine , meteorology
Hard X‐rays having photon energies of higher than 50 keV are characterized by having a high penetration power. These high energy X‐rays are provided by using W‐tubes or at storage rings (synchrotron radiation). Due to the high photon flux and the excellent brilliance of synchrotron radiation, experiments can be carried out quickly. In situ strain experiments can be performed in real time, so that lattice strain evolutions can be investigated in parallel to obtaining conventional stress‐strain curves. Crystallographic texture measurements are time consuming but quick synchrotron measurements at different points of the stress‐strain curve are able to describe the texture evolution during tension or compression, allowing confirmation of texture simulations and yielding material property evolutions during tension or compression experiments.