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Application of Two‐Dimensional Detectors in X‐ray Diffraction Materials Structure Analysis
Author(s) -
Fiala Jaroslav,
Kolega Michal
Publication year - 2006
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/ppsc.200501001
Subject(s) - diffraction , x ray crystallography , detector , materials science , x ray , crystallography , optics , x ray detector , physics , chemistry
Abstract The examination of the azimuthal (lateral) diffraction line profile, i.e., the size, number and shape of individual diffraction spots of which discontinuous diffraction line consist, often reveals useful information on the material's structure which cannot be obtained by the application of other analytical techniques. The information obtained can be advantageously used in the development and optimization of technological processes as well as for monitoring of processes which degrade the material's structure during their use.