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Application of Regression Analysis in spectroturbidity size‐characterization methods
Author(s) -
Vavra Jozef,
Antalik Jozef,
Liška Marek
Publication year - 1995
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/ppsc.19950120106
Subject(s) - turbidity , light scattering , mie scattering , computation , scattering , dynamic light scattering , simplex , characterization (materials science) , optics , physics , mathematics , statistical physics , materials science , quantum mechanics , geometry , algorithm , nanoparticle , geology , oceanography
The possibilities of applying specific turbidity and turbidity theoretical computations of light‐scattering characteristics, the ratio methods in the distributional analysis of PVC and SiO 2 exact Lorenz‐Mie theory was applied. A good correlation with dispersions with spherical particles are discussed. The calculation of the best estimates of distribution function parameters was found were performed numerically using the simplex method. For theoretical computations of light‐scattering characteristics, th exact Lorenz‐Mie theory was applied. A good correlation with the results of angular light scattering and electron microscopy was found.