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The Use of Azimuthal Intensity Variations in Diffraction Patterns for Particle Shape Characterization
Author(s) -
Heffels Cameil M. G.,
Heitzmann Daniel,
Dan Hirleman E.,
Scarlett Brian
Publication year - 1994
Publication title -
particle and particle systems characterization
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 56
eISSN - 1521-4117
pISSN - 0934-0866
DOI - 10.1002/ppsc.19940110305
Subject(s) - azimuth , characterization (materials science) , intensity (physics) , diffraction , particle (ecology) , materials science , optics , physics , geology , oceanography
Forward light scattering is a well established technique for measuring particle size distributions. The light intensity fluctuations which can be observed in the diffraction plane of the instrument can be used to stabilize the inversion process [1]. Particle shape information is also present in these fluctuations. It is shown that an azimuthal‐type of detector can be used to extract this information from the statistical correlations of the detector signals.