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Structural Characterization of γ‐Terpinene Thin Films Using Mass Spectroscopy and X‐Ray Photoelectron Spectroscopy
Author(s) -
Ahmad Jakaria,
Bazaka Kateryna,
Whittle Jason D.,
Michelmore Andrew,
Jacob Mohan V.
Publication year - 2015
Publication title -
plasma processes and polymers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.644
H-Index - 74
eISSN - 1612-8869
pISSN - 1612-8850
DOI - 10.1002/ppap.201400220
Subject(s) - x ray photoelectron spectroscopy , mass spectrometry , analytical chemistry (journal) , spectroscopy , mass spectrum , chemistry , polymerization , plasma polymerization , thin film , characterization (materials science) , materials science , nuclear magnetic resonance , polymer , nanotechnology , organic chemistry , chromatography , physics , quantum mechanics
Understanding the polymerization mechanism of a precursor is indispensable to enhance the requisite material properties. In situ mass spectroscopy and X‐ray photoelectron spectroscopy is used in this study to understand the RF plasma polymerization of γ‐terpinene. High‐resolution mass spectra positive ion mass spectrometry data of the plasma phase demonstrates the presence of oligomeric species of the type [M+H] + and [2M+H] + , where M represents a unit of the starting material. In addition, there is abundant fragmented species, with most dominant being [M + ] (136 m / z ), C 10 H 13 + (133 m / z ), C 9 H 11 + (119 m / z ), and C 7 H 9 + (93 m / z ). The results reported in this manuscript enables to comprehend the relationship between the degree of incorporation of oxygen and the rate of deposition with the input RF power.