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Plasma Process. Polym. 12/2011
Author(s) -
Cech Vladimir,
Trivedi Rutul,
Skoda David
Publication year - 2011
Publication title -
plasma processes and polymers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.644
H-Index - 74
eISSN - 1612-8869
pISSN - 1612-8850
DOI - 10.1002/ppap.201190024
Subject(s) - nanoindentation , materials science , atomic force microscopy , layer (electronics) , polymer , composite material , modulus , cover (algebra) , nanotechnology , mechanical engineering , engineering
Cover: A section of a‐SiC:H multilayer film consisting of polymer‐like bilayers has been investigated using atomic force microscopy, atomic force acoustic microscopy (AFAM), and nanoindentation. The picture shows well‐distinguished individual layers and the Young's modulus and hardness determined for each layer using nanoindentation measurements. Further details can be found in the article by V. Cech,* R. Trivedi, and D. Skoda on page 1107 .