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Electron Ionization of Dimethylphenylsilane – Appearance Energies of Selected Ionic Fragments
Author(s) -
Kočišek Jaroslav,
Stružínský Ondřej,
Sahánková Hana,
Krčma František,
Matejčík Štefan
Publication year - 2012
Publication title -
plasma processes and polymers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.644
H-Index - 74
eISSN - 1612-8869
pISSN - 1612-8850
DOI - 10.1002/ppap.201100079
Subject(s) - ionization , electron ionization , atomic physics , ion , chemistry , ionic bonding , dissociation (chemistry) , molar ionization energies of the elements , electron , bond dissociation energy , double ionization , ionization energy , mass spectrometry , physics , organic chemistry , chromatography , quantum mechanics
Electron ionization (EI) to dimethylphenylsilane (DMPS) is studied in crossed electron‐molecular beams experiment. Using this technique with improved energy resolution of the electron beam, the positive mass spectra and the relative partial cross sections for EI to DMPS are obtained. The ionization energy of DMPS of 9.04 ± 0.06 eV and the threshold energies for dissociative ionization channels are estimated. The bond dissociation energies for single bond cleavage channels are also estimated on the basis of experimental observations. The detection of doubly charged ions of DMPS 2+ (AE = 26.3 ± 1 eV) as well as several other doubly charged fragments is discussed in detail.