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Reliable hot‐spot classification in 10 ms using ultra‐fast lock‐in thermography
Author(s) -
Kasemann Martin,
Walter Benjamin,
Warta Wilhelm
Publication year - 2009
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/pip.901
Subject(s) - hot spot (computer programming) , thermography , sensitivity (control systems) , wafer , computer science , materials science , electronic engineering , engineering , optics , optoelectronics , physics , infrared , operating system
We propose and demonstrate a reliable and non‐destructive spatially resolved measurement technique for ultra‐fast hot‐spot classification of solar cells. The method can deliver quantitative images of the local heat dissipation in hot‐spots in measurement times below 10 ms. The high accuracy and sensitivity allow for reliable hot‐spot testing and provide the basis for a reliable classification of solar cells into different hot‐spot categories. The method can be applied to wafer‐based silicon solar cells and in principle also to thin‐film solar cells of all material compositions. This paper explains the measurement principle, gives a detailed step‐by‐step description of viable automated evaluation procedures, and assesses the sensitivity and accuracy of the method. Copyright © 2009 John Wiley & Sons, Ltd.