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A detailed study of monolithic contacts and electrical losses in a large‐area thin‐film module
Author(s) -
Brecl Kristijan,
Topič Marko,
Smole Franc
Publication year - 2005
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/pip.589
Subject(s) - contact resistance , materials science , contact area , optoelectronics , equivalent series resistance , electrical contacts , layer (electronics) , electrical engineering , thin film , electronic engineering , voltage , engineering , composite material , nanotechnology
A study of the electrical losses of thin‐film modules is presented. Using the electrical circuit simulator PSpice, the influence of the distributed series resistance of the top and the bottom contact of the active area and the influence of the monolithic contact area on the module performance was revealed and demonstrated. A large impact of the distributed series resistance of transparent conducting oxide layer on the module performance was analysed. Study of the monolithic contact area shows a crucial impact of the back‐contact separation cut on the module performance. All other regions that form the monolithic contact contribute significantly to the width of the dead area region in a module. An application of the CIGS‐based study of the monolithic contact on an a‐Si/μc‐Si module is presented. Copyright © 2005 John Wiley & Sons, Ltd.