z-logo
Premium
Physical characterization of thin‐film solar cells
Author(s) -
Durose Ken,
Asher Sally E.,
Jaegermann Wolfram,
Levi Dean,
McCandless Brian E.,
Metzger Wyatt,
Moutinho Helio,
Paulson P.D.,
Perkins Craig L.,
Sites James R.,
Teeter Glenn,
Terheggen Mathias
Publication year - 2004
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/pip.542
Subject(s) - x ray photoelectron spectroscopy , thin film , photoluminescence , characterization (materials science) , materials science , auger electron spectroscopy , cadmium telluride photovoltaics , scanning electron microscope , transmission electron microscopy , analytical chemistry (journal) , optoelectronics , chalcopyrite , spectroscopy , electron beam induced current , ellipsometry , optics , chemistry , nanotechnology , silicon , physics , copper , nuclear magnetic resonance , composite material , chromatography , quantum mechanics , nuclear physics , metallurgy
Abstract The principal techniques used in the physical characterization of thin‐film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X‐ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary‐ion mass spectrometry (SIMS), X‐ray photoelectron spectroscopy (XPS), photoluminescence and time‐resolved photoluminescence (TRPL), electron‐beam‐induced current (EBIC) and light‐beam‐induced current (LBIC). For each method the particular applicability to thin‐film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III–V materials systems. Copyright © 2004 John Wiley & Sons, Ltd.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here