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A versatile computer‐controlled high‐resolution LBIC system
Author(s) -
Martín J.,
FernándezLorenzo C.,
PoceFatou J. A.,
Alcántara R.
Publication year - 2004
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/pip.528
Subject(s) - lens (geology) , optics , wafer , focal length , modular design , micrometer , laser , computer science , wavelength , resolution (logic) , sample (material) , materials science , optoelectronics , physics , artificial intelligence , thermodynamics , operating system
This paper presents the design of versatile equipment for obtaining laser‐beam‐induced current (LBIC) images which allows the study of large surfaces as well as conversion areas of a few micrometers. The modular optomechanical design enables the user to modify the size of the irradiation spot by simply changing the microscope objective used as focal lens, albeit within the limits set by the wavelength. The use of an appropriate calculation algorithm makes it possible to rely on a computerized system to adjust the distance at which the focusing lens must be placed with respect to the sample plane. The possibility of working at micrometer resolution allows one to obtain very significant information for the study of irregularities, manufacturing defects, impurities, grain boundaries, dislocations, recombination centers, etc. in photovoltaic wafers. Copyright © 2004 John Wiley & Sons, Ltd.