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Reconstruction of the surface topography of randomly textured silicon
Author(s) -
Kuchler Gregor,
Brendel Rolf
Publication year - 2003
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/pip.463
Subject(s) - surface (topology) , silicon , electron micrographs , stereoscopy , surface reconstruction , materials science , scanning electron microscope , micrograph , process (computing) , artificial intelligence , computer science , computer graphics (images) , computer vision , optics , algorithm , geometry , mathematics , composite material , optoelectronics , physics , electron microscope , operating system
We describe an algorithm that reconstructs a surface model from stereoscopic scanning electron micrographs of randomly textured silicon surfaces. From the reconstructed model we extract size distributions of the {111}‐faceted upright pyramids. The algorithm is thus a useful tool for statistical control of the texturing process. Copyright © 2002 John Wiley & Sons, Ltd.