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Photoluminescence and electroluminescence imaging of perovskite solar cells
Author(s) -
Hameiri Ziv,
Mahboubi Soufiani Arman,
Juhl Mattias K.,
Jiang Liangcong,
Huang Fuzhi,
Cheng YiBing,
Kampwerth Henner,
Weber Juergen W.,
Green Martin A.,
Trupke Thorsten
Publication year - 2015
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/pip.2716
Subject(s) - electroluminescence , luminescence , perovskite (structure) , photoluminescence , limiting , optoelectronics , materials science , solar cell , open circuit voltage , intensity (physics) , optics , voltage , light emitting diode , physics , nanotechnology , chemistry , quantum mechanics , engineering , layer (electronics) , crystallography , mechanical engineering
Fast camera‐based luminescence‐imaging measurements on perovskite solar cells are presented. The fundamental correlation between the luminescence intensity and the open circuit voltage predicted by the generalised Planck law is confirmed, enabling various quantitative methods for the detection of efficiency‐limiting defects to be applied to this new cell structure. Interstinegly, it is found that this fundamental correlation is valid only for light‐soaked devices. Copyright © 2015 John Wiley & Sons, Ltd.