Premium
The role of disorder in phase transformations in PTFE
Author(s) -
Macturk K. S.,
Farmer B. L.,
Eby R. K.
Publication year - 1995
Publication title -
polymer international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.592
H-Index - 105
eISSN - 1097-0126
pISSN - 0959-8103
DOI - 10.1002/pi.1995.210370302
Subject(s) - diffraction , intensity (physics) , phase (matter) , transformation (genetics) , materials science , layer (electronics) , molecule , chemical physics , crystallography , chemistry , nanotechnology , optics , physics , organic chemistry , biochemistry , gene
The transformation of PTFE from phase II to phase IV at 19°C and atmospheric pressure has been investigated using wide angle X‐ray diffraction. Diffraction patterns were taken as a function of temperature. The integrated intensity of an equatorial peak present only in phase II was used to monitor the extent of the transformation. Peaks on the second and fifth layer lines were used to determine the effect of transformation and/or disorder. Integrated intensities on these three layer lines were shown to decrease differently with increasing temperature. The decrease in intensity on the second and fifth layer lines could be described in terms of a model comprising the initial integrated intensity, fraction transformed and the amount of rotational disorder present. Molecular modeling also was used to investigate the transformation. A commercially available force field was modified to represent the equilibrium solid state of PTFE. The modified force field was used to examine aspects of the transformation including the influence of neighboring molecules on the molecular conformation.