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X‐ray photoelectron spectroscopic study of silk fibroin surface
Author(s) -
Shao Jianzhong,
Liu Jinqiang,
Zheng Jinhuan,
Carr C M
Publication year - 2002
Publication title -
polymer international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.592
H-Index - 105
eISSN - 1097-0126
pISSN - 0959-8103
DOI - 10.1002/pi.1092
Subject(s) - fibroin , x ray photoelectron spectroscopy , tyrosine , silk , sulfur , x ray , chemistry , materials science , polymer chemistry , chemical engineering , nuclear chemistry , organic chemistry , composite material , biochemistry , optics , physics , engineering
X‐ray photoelectron spectroscopy (XPS) has been used to probe the nature of silk fibroin surface, in particular the tyrosine content and sulfur species on the surface. The iodine labelling treatment of silk, followed by XPS surface analysis, reveals that silk fibroin has a tyrosine‐enriched surface, and that there are sulfur‐containing amino acids present on the surface, mainly occurring in the S 6+ component. UV/ozone treatment modifies/removes the surface tyrosine‐ and sulfur‐containing species. © 2002 Society of Chemical Industry