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The relationship between structure and deformation behavior of sulfone polymers
Author(s) -
Chiu HsienTang,
Hwung DaoShinn
Publication year - 1995
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.760350607
Subject(s) - polysulfone , sulfone , materials science , polymer , composite material , micrograph , deformation (meteorology) , ether , transmission electron microscopy , toughness , scanning electron microscope , fracture toughness , polymer chemistry , nanotechnology , organic chemistry , chemistry
The deformation of three types of sulfone polymers—polysulfone (PSF), poly(ether sulfone) (PESF), and polyarylsulfone (PASF)—was performed with a mechanical testing system (MTS). The result and samples were studied using a transmission electron microscope (TEM), a dynamic mechanical analyzer (DMA), and a dielectric thermal analyzer (DETA). Stripes on TEM micrographs for small deformations increase with the fracture toughness ( G Ic ). The activation energy ( E a ) of the α‐transition was determined from DETA. The results show that both E a and TEM micrographs can be used to qualitatively estimate the order of G Ic of sulfone polymers. An energy model was proposed to explain this phenomenon.