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Double Arm pulfrich refractometer: Application to the optical characterization of biaxially stretched polystyrene
Author(s) -
Warenghem M.,
Lefebvre J. M.
Publication year - 1993
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.760332009
Subject(s) - materials science , refractometer , polystyrene , optics , characterization (materials science) , refractive index , anisotropy , total internal reflection , reflection (computer programming) , optoelectronics , composite material , polymer , nanotechnology , computer science , physics , programming language
An experimental setup is presented that enables the whole optical characterization of an anisotropic medium to be achieved at the same spot. Based on total internal reflection measurements, the Double Arm Pulfrich Refractometer provides high precision simultaneous refractive index data, which are gathered without moving the sample. This technique is particularly well suited to the case of biaxial materials. Illustration of its potential is given on some preliminary orientation measurements of biaxially stretched polystyrene films.