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Laser interferometry: A measurement technique for diffusion studies in thin polymer films
Author(s) -
Saenger K. L.,
Tong H. M.
Publication year - 1991
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.760310608
Subject(s) - materials science , refractive index , interferometry , laser , diffusion , polymer , polyimide , optics , thin film , dissolution , methyl methacrylate , solvent , optoelectronics , composite material , chemical engineering , nanotechnology , copolymer , organic chemistry , chemistry , physics , engineering , layer (electronics) , thermodynamics
Abstract Laser interferometric techniques have many applications in the area of thin film science and technology due to their sensitivity, simplicity, and low cost. Typically, changes in thickness and/or refractive index of a transparent polymer film sample are detected from changes in film reflectivity, as measured by variations in the intensity of reflected laser light. Diffusion related properties such as solvent uptake/swelling, dissolution, and drying rates are accessible with laser interferometry since each of these processes involves a change in the film's thickness and/or refractive index. The principles and basic experimental considerations common to these three applications will be discussed. Illustrative examples from our lab will include n‐methyl‐2‐pyrrolidone diffusion in polyimide, and methanol diffusion in poly(methyl methacrylate).