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Positional small angle X‐ray scattering from flaws
Author(s) -
LeGrand D. G.
Publication year - 1984
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.760240512
Subject(s) - magnification , scattering , small angle scattering , materials science , simple (philosophy) , interpretation (philosophy) , small angle x ray scattering , optics , x ray , computer science , physics , programming language , philosophy , epistemology
A simple theory of PSAXS (positional small angle X‐ray scattering) has been developed and used to aid in the interpretation of PSAXS data from flaws. The importance of the various experimental parameters has been studied and an explanation offered for apparent magnification. A comparison between images created by assumed flaw structures and from actual flaws has been made. It is proposed that three dimensional imaging of flaws can be performed.