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The interface microscopy of crystalline linear high polymers
Author(s) -
Sullivan P.,
Wunderlich B.
Publication year - 1964
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.760040210
Subject(s) - optical microscope , materials science , microscopy , interference microscopy , polarized light microscopy , lamellar structure , microscope , optics , polymer , interference (communication) , beam (structure) , interferometry , polyethylene , composite material , scanning electron microscope , channel (broadcasting) , physics , electrical engineering , engineering
Solution‐grown crystals of polyethylene may reach lateral dimensions large enough for optical microscopy. Interference microscopy represents, in this case, a suitable method of observation of morphology and defects as well as quantitative determinations. The double‐beam interference method used in the Baker type microscope has been applied to determine refractive indices and lamellar thicknesses. The Nomarski double‐beam interferometer has been used for hot‐stage experiments. Multiple‐beam techniques involving silvering of crystal surfaces and using an ordinary light microscope for observation have been developed. The applicability of the different types of interference microscopy to polymer research is illustrated in a series of representative photomicrographs of polyethylene.