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Physical techniques used in studying interfacial phenomena
Author(s) -
Patrick Robert L.
Publication year - 1961
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.760010409
Subject(s) - materials science , ellipsometry , adsorption , diffraction , desorption , substrate (aquarium) , contact angle , planar , yield (engineering) , electron diffraction , infrared , analytical chemistry (journal) , optics , nanotechnology , thin film , chemical engineering , composite material , chemistry , organic chemistry , computer science , physics , oceanography , computer graphics (images) , geology , engineering
Adsorption studies on powdered and planar surfaces yield significant information regarding the rate and degree of interaction between the substrate and the organic adsorbate. Investigative tools include contact angle measurement, radiotracer methods, ellipsometry, x‐ray diffraction, electron diffraction, elegant infrared techniques, dynamic desorption techniques, and film balance applications.