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Surface topography and gloss of polyolefin blown films
Author(s) -
Wang Lei,
Huang Tao,
Kamal M. R.,
Rey Alejandro D.,
Teh Joo
Publication year - 2000
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.11204
Subject(s) - gloss (optics) , materials science , surface roughness , polyolefin , surface finish , atomic force microscopy , composite material , characterization (materials science) , low density polyethylene , optics , polyethylene , nanotechnology , coating , layer (electronics) , physics
Atomic Force Microscopy (AFM) was used to obtain a comprehensive characterization of the surface roughness of polyethylene blown films based on a variety of resins. The quantitative description of surface roughness was achieved using a number of statistical parameters. Surface gloss of the sample films was calculated using the general Kirchhoff solution for rough surfaces. The calculated gloss values showed good agreement with experimental measurements. The quality of the correlation suggests the utility of AFM in characterization of surface roughness. It also suggests that the proposed mathematical and statistical description of roughness is a useful tool for the estimation of surface gloss.