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Characterization of anisotropic structure in poly(phenylene vinylene) films
Author(s) -
Ou Runqing,
Samuels Robert,
Wang Xingwu,
Gregory Richard
Publication year - 2001
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.10868
Subject(s) - materials science , dichroism , anisotropy , planar , infrared , diffraction , phenylene , crystal structure , prism , characterization (materials science) , poly(p phenylene vinylene) , optics , crystallography , composite material , polymer , nanotechnology , chemistry , physics , computer graphics (images) , computer science , conjugated system
The evolution of the anisotropic structure in poly(phenylene vinylene) (PPV) films was studied using three nondestructive characterization techniques: prism waveguide coupling, infrared dichroism, and X‐ray diffraction. The anisotropic PPV films were thermally converted from precursor drawn films at fixed length. The three‐dimensional refractive indices, infrared dichroic ratios, crystal alignment, and orientation function were determined from each film. The results show that converted cast PPV film has a highly planar structure with a tendency for the PPV chains to orient parallel to the film surface. The a axis of the crystal unit cell is normal to the film plane. One‐way stretching converts the film from a planar structure to a uniaxial structure.