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Probe segregation and T g determination of a supported ultra‐thin polystyrene film studied by X‐ray and neutron reflectivity, and SIMS
Author(s) -
White Chris,
Wu WenLi,
Pu Yuxie,
Rafailovich M.,
Sokolov J.
Publication year - 2003
Publication title -
polymer engineering and science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.503
H-Index - 111
eISSN - 1548-2634
pISSN - 0032-3888
DOI - 10.1002/pen.10105
Subject(s) - materials science , polystyrene , x ray reflectivity , thin film , analytical chemistry (journal) , reflectivity , neutron , quartz , thermal expansion , polymer , neutron reflectometry , optics , composite material , neutron scattering , nanotechnology , chemistry , small angle neutron scattering , physics , chromatography , quantum mechanics
Selective deuteration combined with X‐ray and neutron reflectivity has been used to determine the extent of probe segregation to an interface in ultra‐thin polymer films as a function of the number of thermal cycles. The extent of probe segregation to the interface was also investigated using Secondary Ion Mass Spectroscopy (SIMS). Significant probe segregation was not evident in these studies. X‐ray reflectivity has also been employed to measure the coefficient of thermal expansion of ultra‐thin polystyrene films supported on quartz. The glass transition temperature determined with this method is equivalent to that measured for bulk polystyrene films.