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In situ characterization of surface‐layer structure evolution in γ‐irradiated carbon fibers by X‐ray photoelectron spectroscopy combined with argon‐ion sputtering
Author(s) -
Liu Liangsen,
Wang Haibo,
Zhao Lihuan,
Xu Zhiwei,
Sui Xianhang,
Feng Tingting,
Li Nan,
Li Jing,
Chen Cheng,
Lv Hanming
Publication year - 2019
Publication title -
polymer composites
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.577
H-Index - 82
eISSN - 1548-0569
pISSN - 0272-8397
DOI - 10.1002/pc.25037
Subject(s) - x ray photoelectron spectroscopy , sputtering , argon , materials science , irradiation , ion , analytical chemistry (journal) , epoxy , carbon fibers , surface layer , composite material , layer (electronics) , in situ , chemical engineering , composite number , thin film , nanotechnology , chemistry , organic chemistry , physics , nuclear physics , engineering
In this article, the surface‐layer structure evolution of carbon fibers along the cross‐section γ‐irradiated in epoxy chloropropane has been estimated by X‐ray photoelectron spectroscopy combined with in situ argon‐ion sputtering that is different from argon‐ion cleaning. In argon‐ion (Ar‐ion) sputtering, the detection and sputtering were alternately in situ carried out. The penetration depth of irradiation medium on the surface of carbon fibers was accurately verified (13 nm) according to the absence of chlorine element and the change of O/C atomic ratio on γ‐irradiated carbon fiber surface. Such characterization technology has opened up a meaningful method to analyze the heterogeneous structure of materials. POLYM. COMPOS., 40:E832–E834, 2019. © 2018 Society of Plastics Engineers