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The effect of moderate pressure on the crystalline structure of oriented polypropylene tapes using in situ X‐ray diffraction
Author(s) -
ShavitHadar Liron,
Rein Dmitry M.,
Khalfin Rafail L.,
Terry Ann E.,
Cohen Yachin
Publication year - 2007
Publication title -
polymers for advanced technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.61
H-Index - 90
eISSN - 1099-1581
pISSN - 1042-7147
DOI - 10.1002/pat.922
Subject(s) - materials science , polypropylene , tacticity , diffraction , recrystallization (geology) , synchrotron , synchrotron radiation , in situ , composite material , atmospheric pressure , x ray , high pressure , analytical chemistry (journal) , optics , thermodynamics , polymer , polymerization , organic chemistry , chemistry , meteorology , paleontology , physics , biology
Highly oriented isotactic polypropylene tapes were examined under moderate pressure by heating and cooling during in situ X‐ray diffraction (XRD) measurements using synchrotron radiation. The formation of γ ‐isotatic polypropylene (iPP) is observed upon recrystallization under pressure from the melt. The amount of γ ‐iPP formed, as a function of pressure, exhibits a minimum at about 100 MPa. Upon applying moderate pressure (up to 60 MPa) significant changes are observed in the unit cell parameters, compared to their values at atmospheric pressure. At pressures above 60 MPa only a small decrease in the b unit cell parameter is observed. Copyright © 2007 John Wiley & Sons, Ltd.