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Mechanical, thermal, and UV‐shielding behavior of silane surface modified ZnO‐reinforced phthalonitrile nanocomposites
Author(s) -
Derradji Mehdi,
Ramdani Noureddine,
Gong Lindan,
Wang Jun,
Xu Xiaodong,
Lin Zaiwen,
Henniche Abdelkhalek,
Liu Wenbin
Publication year - 2016
Publication title -
polymers for advanced technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.61
H-Index - 90
eISSN - 1099-1581
pISSN - 1042-7147
DOI - 10.1002/pat.3744
Subject(s) - materials science , composite material , thermogravimetric analysis , nanocomposite , dynamic mechanical analysis , ultimate tensile strength , phthalonitrile , scanning electron microscope , glass transition , silane , toughness , polymer , chemical engineering , phthalocyanine , nanotechnology , engineering
In the present work, zinc oxide nanoparticles were treated with aminopropyl trimethoxy silane‐coupling agent and used as a new kind of reinforcement for a typical high performance bisphenol‐A‐based phthalonitrile resin. The resulted nanocomposites were characterized for their mechanical, thermal, and optical properties. Results from the tensile test indicated that the tensile strength and modulus as well as the toughness state of the matrix were all enhanced with the increasing of the nanoparticles amount. Thermogravimetric analysis showed that the starting decomposition temperatures and the residual weight at 800°C were highly improved upon adding the nanofillers. At 6 wt% nanoloading, the glass transition temperature and the storage modulus were considerably enhanced reaching about 359°C and 3.7 GPa, respectively. The optical tests revealed that the neat resin possesses excellent UV‐shielding properties, which were further enhanced by adding the nanofillers. Furthermore, the fractured surfaces of the nanocomposites analyzed by scanning electron microscope exhibited homogeneous and rougher surfaces compared with that of the pristine resin. Finally, the good dispersion of the reinforcing phase into the matrix was confirmed by a high resolution transmission electron microscope. Copyright © 2015 John Wiley & Sons, Ltd.