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Investigation of correlation between microstructure and dielectric properties of cyanate ester/silicate tube hybrids by positron annihilation lifetime spectroscopy
Author(s) -
Zhuo Dongxian,
Gu Aijuan,
Wang Yuanzhen,
Liang Guozheng,
Hu Jiangtao,
Yuan Li,
Yao Wei
Publication year - 2012
Publication title -
polymers for advanced technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.61
H-Index - 90
eISSN - 1099-1581
pISSN - 1042-7147
DOI - 10.1002/pat.2027
Subject(s) - materials science , cyanate ester , dielectric , microstructure , spectroscopy , positron annihilation spectroscopy , doppler broadening , dielectric spectroscopy , composite material , analytical chemistry (journal) , dielectric loss , nuclear magnetic resonance , spectral line , positron , positron annihilation , chemistry , nuclear physics , physics , optoelectronics , chromatography , electrode , quantum mechanics , astronomy , electrochemistry , electron
The correlation between microstructure and dielectric properties of cyanate ester (CE)/hollow silicate tube (HST) hybrids was investigated by positron annihilation lifetime spectroscopy, coincidence Doppler‐broadening spectroscopy, Fourier transform infrared spectra, and dynamic mechanical analyses. The addition of HST to CE resin brings a multi‐aspect influence (cross‐linked structure and density, free volume, and interfacial action) on the structure of the cross‐linked network and thus results in significantly varied dielectric properties. There is an optimum content of HST in hybrids to get the lowest dielectric constant and loss. When the content of HST is smaller than the percolation threshold, the hybrid has decreased dielectric constant and loss; this mainly results in the reduced size of free volume and orthopositronium intensity ( I 3 ), although when the content of HST is larger than the threshold, the increased I 3 and the size of free volume as well as the interfacial polarization are responsible for the significantly enlarged dielectric constant and loss. Copyright © 2011 John Wiley & Sons, Ltd.