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Radiation degradation of poly(arylene ether ketone)s
Author(s) -
Heiland Kirstin,
Hill David J. T.,
O'Donnell James H.,
Pomery Peter J.
Publication year - 1994
Publication title -
polymers for advanced technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.61
H-Index - 90
eISSN - 1099-1581
pISSN - 1042-7147
DOI - 10.1002/pat.1994.220050206
Subject(s) - arylene , radical , substituent , ether , materials science , polymer , ketone , irradiation , polymer chemistry , radiation resistance , degradation (telecommunications) , ionizing radiation , photochemistry , organic chemistry , chemistry , aryl , alkyl , composite material , telecommunications , physics , computer science , nuclear physics
The resistance of five poly(arylene ether ketone)s with related chemical structures to degradation by ionizing radiation has been studied by ESR spectroscopy and yields of volatile products. All of the polymers showed high resistance to radiation with low yields of radicals after irradiation in vacuum at 77 K (when up to 84% of the radicals were identified as radical anions) and much lower yields at 300 K. The yields of volatile products were much less than reported for poly(arylene sulfone)s [1, 2]. Methyl substitution on a main‐chain aromatic ring decreased the radiation resistance, but methane only comprised 10% of the volatile products from the methyl‐substituted polymers. A polymer containing an isopropylidene group in the main chain and a substituent aromatic carbonyl showed significantly decreased radiation resistance. Extremely low radical yields were obtained after irradiation in air at 300 K, contrary to many polymers. XPS analysis showed an increase in C–O bonds on the surface after irradiation in air.