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On the behaviour of thin liquid layers at curved solid edges
Author(s) -
Sommer Oliver,
Wozniak Günter
Publication year - 2014
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.201410325
Subject(s) - solid surface , materials science , enhanced data rates for gsm evolution , lubrication , layer (electronics) , viscosity , surface tension , field (mathematics) , thin film , plane (geometry) , composite material , nanotechnology , chemical physics , chemistry , thermodynamics , computer science , geometry , physics , mathematics , telecommunications , pure mathematics
The knowledge of the behaviour of thin liquid layers on solid surfaces is of fundamental interest as far as basic research and applications like technical covering or lubrication processes are concerned. The subject is currently of increasing importance, particularly due to stronger requirements of thin liquid layer functionalities. We therefore studied the development of the liquid layer thickness distribution field as well as the liquid layer disturbance propagation on a plane solid surface in the vicinity of a curved solid edge experimentally using LIF technique. The investigation focusses on the influence of the initial layer thickness as well as on liquid properties like viscosity and surface tension on the liquid film behaviour, especially close to solid edges. Selected experimental results are shown highlighting relevant quantities with respect to disturbance propagation and validation. (© 2014 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)