Premium
Phase‐field simulation of the electro‐mechanical response of ferroelectrics during Piezoresponse Force Microscopy
Author(s) -
Thai Huy,
Keip MarcAndré,
Schröder Jörg
Publication year - 2013
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.201310061
Subject(s) - piezoresponse force microscopy , ferroelectricity , anisotropy , isotropy , transverse isotropy , materials science , condensed matter physics , field (mathematics) , phase (matter) , nanotechnology , physics , optics , optoelectronics , dielectric , mathematics , quantum mechanics , pure mathematics
The contribution adresses the simulation of ferroelectric matrials in the framework of the Piezoresponse Force Microscopy (PFM). Based on the PFM, ferroelectric domain structures can be analyzed in great detail by measuring the electrically induced mechanical deformations of the surface of a ferroelectric. We employ a flexible continuum‐mechanical model based on the phase‐field method in order to analyze the behavior of ferroelectric microstructures numerically. Since ferroelectric materials are often highly anisotropic, the phase‐field formulation will account for transversely isotropic symmetry. (© 2013 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)