FE‐modeling of ideal grain growth based on preprocessed EBSD data | Zendy

Gladkov Slawa | Zendy; Kayser Tobias | Zendy; Svendsen Bob | Zendy

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FE‐modeling of ideal grain growth based on preprocessed EBSD data

Author(s) -

Gladkov Slawa,

Kayser Tobias,

Svendsen Bob

Publication year - 2011

Publication title -

pamm

Language(s) - English

Resource type - Journals

ISSN - 1617-7061

DOI - 10.1002/pamm.201110227

Subject(s) - micrograph , ideal (ethics) , preprocessor , context (archaeology) , electron backscatter diffraction , data pre processing , grain growth , electron micrographs , finite element method , materials science , computer science , algorithm , grain size , artificial intelligence , engineering , scanning electron microscope , metallurgy , geology , optics , structural engineering , composite material , electron microscope , physics , microstructure , paleontology , philosophy , epistemology

The purpose of this work is to show the use of experimentally measured micrograph data in the context of ideal grain growth simulation which is modeled with a help of finite element method. In this regard the micrograph data is considered as initial condition for a grain growth simulation. General remarks on preparation (preprocessing) of the micrographs and staggered algorithmic formulation are presented. (© 2011 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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