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FE‐modeling of ideal grain growth based on preprocessed EBSD data
Author(s) -
Gladkov Slawa,
Kayser Tobias,
Svendsen Bob
Publication year - 2011
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.201110227
Subject(s) - micrograph , ideal (ethics) , preprocessor , context (archaeology) , electron backscatter diffraction , data pre processing , grain growth , electron micrographs , finite element method , materials science , computer science , algorithm , grain size , artificial intelligence , engineering , scanning electron microscope , metallurgy , geology , optics , structural engineering , composite material , electron microscope , physics , microstructure , paleontology , philosophy , epistemology
The purpose of this work is to show the use of experimentally measured micrograph data in the context of ideal grain growth simulation which is modeled with a help of finite element method. In this regard the micrograph data is considered as initial condition for a grain growth simulation. General remarks on preparation (preprocessing) of the micrographs and staggered algorithmic formulation are presented. (© 2011 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)