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Modelling of cracks on different scales in ferroelectric materials
Author(s) -
Gellmann Roman,
Ricoeur Andreas
Publication year - 2011
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.201110226
Subject(s) - mesoscopic physics , materials science , ferroelectricity , fracture toughness , composite material , toughness , dielectric , poling , polarization (electrochemistry) , shear (geology) , length scale , condensed matter physics , mechanics , physics , optoelectronics , chemistry
In this work we study contributions to the effective fracture toughness of ferroelectric materials arising from effects on macroscopic and mesoscopic scales of the system. On the macroscopic scale, the crack in a ferroelectric material is modeled taking into account an extended theory of stresses at interfaces in dielectric solids [1‐3]. We predict several new effects, such as the “poling effect”, “collinear effect” and the coupling of a Mode‐II shear loading and the Mode‐I SIF. Further, on the mesoscopic scale, we study the influence of polarization switching limited to the fracture process zone (small scale switching) on the fracture toughness. (© 2011 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)