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Reliability of silo structure with geometric imperfections
Author(s) -
Górski Jarosław,
Mikulski Tomasz
Publication year - 2009
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.200910248
Subject(s) - silo , gaussian , reliability (semiconductor) , random field , probabilistic logic , uncorrelated , mathematics , conditional probability distribution , structural engineering , statistical physics , engineering , statistics , physics , mechanical engineering , power (physics) , quantum mechanics
Reliability of a silo structure with geometric imperfections is estimated. As the silo cylindrical constructions can be loaded with pressure below the atmospheric any geometric discrepancies are very dangerous and can significantly reduce their capacities. A probabilistic approach was applied. Two cases were considered. The imperfections were described by a uniform and a truncated Gaussian distribution. In the first case an uncorrelated random field was considered while in the second a theoretical nonhomogeneous correlation function was formulated. The realizations of the random imperfection fields are generated using a conditional rejection method. A version of a stratified sampling method is applied. (© 2009 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)